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(a) Sketch of the Kretschmann–Raether configuration. The prism is quoted and the radiation wavevector k has been decomposed in its parallel, β , and perpendicular, k x , components. (b) Scanning electron microscopy (SEM) image of the focused ion beam (FIB) milled cross-section of the deposited 1D-PC and a sketch of the transverse geometry with measured layer thicknesses. (c) R (θ,λ) reflectance map according to the transfer-matrix method <t>(TMM)</t> calculation for σ polarization. The black and red lines are the photonic band edges (BEs), calculated for the infinitely extended 1D-PC. The surface waves (SWs) and the band-edge (BE) modes appear as dark reflectance lines. In the insets, we plot the square modulus of the electric fields of the modes, superimposed on the 1D-PC refractive index distribution. The external medium is vacuum.
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(a) Sketch of the Kretschmann–Raether configuration. The prism is quoted and the radiation wavevector k has been decomposed in its parallel, β , and perpendicular, k x , components. (b) Scanning electron microscopy (SEM) image of the focused ion beam (FIB) milled cross-section of the deposited 1D-PC and a sketch of the transverse geometry with measured layer thicknesses. (c) R (θ,λ) reflectance map according to the transfer-matrix method <t>(TMM)</t> calculation for σ polarization. The black and red lines are the photonic band edges (BEs), calculated for the infinitely extended 1D-PC. The surface waves (SWs) and the band-edge (BE) modes appear as dark reflectance lines. In the insets, we plot the square modulus of the electric fields of the modes, superimposed on the 1D-PC refractive index distribution. The external medium is vacuum.
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(a) Sketch of the Kretschmann–Raether configuration. The prism is quoted and the radiation wavevector k has been decomposed in its parallel, β , and perpendicular, k x , components. (b) Scanning electron microscopy (SEM) image of the focused ion beam (FIB) milled cross-section of the deposited 1D-PC and a sketch of the transverse geometry with measured layer thicknesses. (c) R (θ,λ) reflectance map according to the transfer-matrix method <t>(TMM)</t> calculation for σ polarization. The black and red lines are the photonic band edges (BEs), calculated for the infinitely extended 1D-PC. The surface waves (SWs) and the band-edge (BE) modes appear as dark reflectance lines. In the insets, we plot the square modulus of the electric fields of the modes, superimposed on the 1D-PC refractive index distribution. The external medium is vacuum.
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(a) Sketch of the Kretschmann–Raether configuration. The prism is quoted and the radiation wavevector k has been decomposed in its parallel, β , and perpendicular, k x , components. (b) Scanning electron microscopy (SEM) image of the focused ion beam (FIB) milled cross-section of the deposited 1D-PC and a sketch of the transverse geometry with measured layer thicknesses. (c) R (θ,λ) reflectance map according to the transfer-matrix method <t>(TMM)</t> calculation for σ polarization. The black and red lines are the photonic band edges (BEs), calculated for the infinitely extended 1D-PC. The surface waves (SWs) and the band-edge (BE) modes appear as dark reflectance lines. In the insets, we plot the square modulus of the electric fields of the modes, superimposed on the 1D-PC refractive index distribution. The external medium is vacuum.
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(a) Sketch of the Kretschmann–Raether configuration. The prism is quoted and the radiation wavevector k has been decomposed in its parallel, β , and perpendicular, k x , components. (b) Scanning electron microscopy (SEM) image of the focused ion beam (FIB) milled cross-section of the deposited 1D-PC and a sketch of the transverse geometry with measured layer thicknesses. (c) R (θ,λ) reflectance map according to the transfer-matrix method <t>(TMM)</t> calculation for σ polarization. The black and red lines are the photonic band edges (BEs), calculated for the infinitely extended 1D-PC. The surface waves (SWs) and the band-edge (BE) modes appear as dark reflectance lines. In the insets, we plot the square modulus of the electric fields of the modes, superimposed on the 1D-PC refractive index distribution. The external medium is vacuum.
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(a) Sketch of the Kretschmann–Raether configuration. The prism is quoted and the radiation wavevector k has been decomposed in its parallel, β , and perpendicular, k x , components. (b) Scanning electron microscopy (SEM) image of the focused ion beam (FIB) milled cross-section of the deposited 1D-PC and a sketch of the transverse geometry with measured layer thicknesses. (c) R (θ,λ) reflectance map according to the transfer-matrix method <t>(TMM)</t> calculation for σ polarization. The black and red lines are the photonic band edges (BEs), calculated for the infinitely extended 1D-PC. The surface waves (SWs) and the band-edge (BE) modes appear as dark reflectance lines. In the insets, we plot the square modulus of the electric fields of the modes, superimposed on the 1D-PC refractive index distribution. The external medium is vacuum.
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(a) Sketch of the Kretschmann–Raether configuration. The prism is quoted and the radiation wavevector k has been decomposed in its parallel, β , and perpendicular, k x , components. (b) Scanning electron microscopy (SEM) image of the focused ion beam (FIB) milled cross-section of the deposited 1D-PC and a sketch of the transverse geometry with measured layer thicknesses. (c) R (θ,λ) reflectance map according to the transfer-matrix method <t>(TMM)</t> calculation for σ polarization. The black and red lines are the photonic band edges (BEs), calculated for the infinitely extended 1D-PC. The surface waves (SWs) and the band-edge (BE) modes appear as dark reflectance lines. In the insets, we plot the square modulus of the electric fields of the modes, superimposed on the 1D-PC refractive index distribution. The external medium is vacuum.
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MathWorks Inc transfer matrix model
(a) Sketch of the Kretschmann–Raether configuration. The prism is quoted and the radiation wavevector k has been decomposed in its parallel, β , and perpendicular, k x , components. (b) Scanning electron microscopy (SEM) image of the focused ion beam (FIB) milled cross-section of the deposited 1D-PC and a sketch of the transverse geometry with measured layer thicknesses. (c) R (θ,λ) reflectance map according to the transfer-matrix method <t>(TMM)</t> calculation for σ polarization. The black and red lines are the photonic band edges (BEs), calculated for the infinitely extended 1D-PC. The surface waves (SWs) and the band-edge (BE) modes appear as dark reflectance lines. In the insets, we plot the square modulus of the electric fields of the modes, superimposed on the 1D-PC refractive index distribution. The external medium is vacuum.
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(a) Sketch of the Kretschmann–Raether configuration. The prism is quoted and the radiation wavevector k has been decomposed in its parallel, β , and perpendicular, k x , components. (b) Scanning electron microscopy (SEM) image of the focused ion beam (FIB) milled cross-section of the deposited 1D-PC and a sketch of the transverse geometry with measured layer thicknesses. (c) R (θ,λ) reflectance map according to the transfer-matrix method (TMM) calculation for σ polarization. The black and red lines are the photonic band edges (BEs), calculated for the infinitely extended 1D-PC. The surface waves (SWs) and the band-edge (BE) modes appear as dark reflectance lines. In the insets, we plot the square modulus of the electric fields of the modes, superimposed on the 1D-PC refractive index distribution. The external medium is vacuum.

Journal: ACS Applied Materials & Interfaces

Article Title: Low-Temperature Stability and Sensing Performance of Mid-Infrared Bloch Surface Waves on a One-Dimensional Photonic Crystal

doi: 10.1021/acsami.2c07894

Figure Lengend Snippet: (a) Sketch of the Kretschmann–Raether configuration. The prism is quoted and the radiation wavevector k has been decomposed in its parallel, β , and perpendicular, k x , components. (b) Scanning electron microscopy (SEM) image of the focused ion beam (FIB) milled cross-section of the deposited 1D-PC and a sketch of the transverse geometry with measured layer thicknesses. (c) R (θ,λ) reflectance map according to the transfer-matrix method (TMM) calculation for σ polarization. The black and red lines are the photonic band edges (BEs), calculated for the infinitely extended 1D-PC. The surface waves (SWs) and the band-edge (BE) modes appear as dark reflectance lines. In the insets, we plot the square modulus of the electric fields of the modes, superimposed on the 1D-PC refractive index distribution. The external medium is vacuum.

Article Snippet: Based on the real 1D-PC geometry and materials’ optical properties, the room temperature numerical simulation of the reflectance R (θ,λ) was carried out by a proprietary transfer-matrix method (TMM) MATLAB code.

Techniques: Electron Microscopy, Refractive Index